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Identification of hydrogen-induced changes in atomic deformation of ferroelectric SrBi2Nb2O9 thin film using transmission electron microscopy

Authors

Kim, Yong Tae; KIM IK SOO; Kim, Seong Il; Dong Chul Yoo; In-Hoon Choi

Citation

International Conference on Electroceramics

URI

https://pubs.kist.re.kr/handle/201004/105563

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KIST Conference Paper > Others

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