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Enhancement of ferroelectric properties of SrBi2Nb2O9 thin films by oxygen plasma rapid thermal annealing

Authors

KIM IK SOO; Young Mi Kim; Kim, Yong Tae; Kim, Seong Il; In-Hoon Choi

Citation

The 11th Korean Conference on Semiconductors, v.2, pp.447 - 448

URI

https://pubs.kist.re.kr/handle/201004/105567

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KIST Conference Paper > Others

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