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dc.contributor.authorH.J.Kim-
dc.contributor.authorChang Joonyeon-
dc.contributor.authorY.H.Xie-
dc.date.accessioned2024-01-13T13:01:08Z-
dc.date.available2024-01-13T13:01:08Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/107029-
dc.languageEnglish-
dc.titleA novel technique for the measurement of Ge adatom surface migration length on Si(001)-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation2002 MRS Spring Meeting-
dc.citation.title2002 MRS Spring Meeting-
dc.citation.conferencePlaceUS-
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