Vieillissement des transistors MOS submicroniques apres contrainte electrique revue.

Title
Vieillissement des transistors MOS submicroniques apres contrainte electrique revue.
Authors
강광남
Keywords
transistors MOS
Issue Date
1984-01
Publisher
Phys. appl.
Citation
v. 19, 933-?
URI
http://pubs.kist.re.kr/handle/201004/10712
Appears in Collections:
KIST Publication > Article
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