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Transmission electron microscopy (TEM) study of the degradation mechanism of amorphous vanadium oxide based thin film battery

Authors

김한기; 0; 전은정; Cho Won Il; Yoon Young Soo

Citation

2001 Joint International Meeting Abstract (Journal of the Electrochemical Society), v.148, no.4, pp.#37

URI

https://pubs.kist.re.kr/handle/201004/107406

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KIST Conference Paper > Others

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