Fabrication and dc characterization of submicron gate GaAs MESFET.

Title
Fabrication and dc characterization of submicron gate GaAs MESFET.
Authors
강광남
Keywords
GaAs; MESFET
Issue Date
1986-01
Publisher
Proc. Korean electronics eng.
Citation
v. 9, no. 2, 145-?
URI
http://pubs.kist.re.kr/handle/201004/10743
Appears in Collections:
KIST Publication > Conference Paper
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE