KIST Library Institutional Repository

PEEM and NEXAFS analysis of wear debris of Si incorporated dianomd like carbon films in various envrionments

Authors

박세준; EUN KWANG YONG; Lee Kwang Ryeol; Andreas Scholl; Frithjof Nolting; H. Padmore

Citation

Proceedings of the Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conferen, pp.454

Keywords

pnotoemission electron microscopic analysis

URI

https://pubs.kist.re.kr/handle/201004/107495

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML