PEEM and NEXAFS study of DLC debris

Authors
EUN KWANG YONG박세준Lee Kwang RyeolAndreas SchollFrithjof Nolting
Citation
제 13 차 방사광 이용자 연구 발표회 = Proceedings of the 13th Synchrotron Radiation Users', pp.161 - 162.
Keywords
photo emission electron microscope
URI
https://pubs.kist.re.kr/handle/201004/107867
Appears in Collections:
KIST Conference Paper > Others
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