Hot-carrier-induced deradation in submicron MOS transistors.

Title
Hot-carrier-induced deradation in submicron MOS transistors.
Authors
강광남최병진
Keywords
MOS transistors
Issue Date
1988-01
Publisher
전자공학회논문지
Citation
v. 25, no. 7, 780-?
URI
http://pubs.kist.re.kr/handle/201004/10805
Appears in Collections:
KIST Publication > Article
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