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The influence of ambient gases on the emission characteristics of Mo-FEAs during the frit-sealing cycle

Authors

N. Y. Lee; 김봉철; Jung Jae Hoon; 강문식; H. Kim; Ju Byeong Kwon; LEE YUN HI; OH MYUNG HWAN; J. Jang; AN SE YOUNG

Citation

SID 99 Digest, pp.584 - 587

Keywords

FED; FEA; MEMS

ISSN

0099-0966

URI

https://pubs.kist.re.kr/handle/201004/109215

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KIST Conference Paper > Others

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