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dc.contributor.authorLEE YUN HI-
dc.contributor.authorSHIN KYEONG SIK-
dc.contributor.authorKIM YOUNG SIK-
dc.contributor.author장윤택-
dc.contributor.authorJu Byeong Kwon-
dc.contributor.authorOH MYUNG HWAN-
dc.contributor.author성만영-
dc.date.accessioned2024-01-13T17:02:19Z-
dc.date.available2024-01-13T17:02:19Z-
dc.date.created2021-09-29-
dc.identifier.issn0099-0966-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/109234-
dc.languageEnglish-
dc.subjectELD-
dc.subjectthin film-
dc.subjectphosphor-
dc.titleElectrical properties of interfaces and turn-on characteristics of TFEL devices-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSID 99 Digest, pp.600 - 603-
dc.citation.titleSID 99 Digest-
dc.citation.startPage600-
dc.citation.endPage603-
dc.citation.conferencePlaceUS-
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