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Development of feature-based intelligent inspection planning system for CMM

Other Titles

CMM 을 이용한 특징형상 기반 지능형 검사계획 시스템 개발

Authors

Ha Sung Do; HWANG IN-SHIK

Citation

한국정밀공학회 '99 년도 춘계학술대회논문집, pp.1086 - 1091

Keywords

검사 계획

URI

https://pubs.kist.re.kr/handle/201004/109241

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KIST Conference Paper > Others

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