Study of crystallographical defects of the GaN micro-crystals by Raman spectroscopy and X-ray diffraction

Title
Study of crystallographical defects of the GaN micro-crystals by Raman spectroscopy and X-ray diffraction
Authors
고의관C.S. Park박일우박용주김은규조성호
Keywords
GaN
Issue Date
1998-11
Publisher
The 9th Seoul International Symposium on the Physics of Semiconductors and Applications - 1998
Citation
, 125-126
URI
http://pubs.kist.re.kr/handle/201004/11016
Appears in Collections:
KIST Publication > Conference Paper
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