Full metadata record

DC Field Value Language
dc.contributor.author강문상-
dc.contributor.authorJEON BUP JU-
dc.contributor.authorLim Tae Hoon-
dc.contributor.authorOh In Hwan-
dc.date.accessioned2024-01-13T21:31:15Z-
dc.date.available2024-01-13T21:31:15Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/111575-
dc.languageEnglish-
dc.titleThe characteristics of a-Si:H films as a function of H2/SiH4 ratio in EVR CVD-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE international conference on microelectronics, Cario, Egypt.-
dc.citation.titleIEEE international conference on microelectronics, Cario, Egypt.-
dc.citation.conferencePlaceUA-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE