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dc.contributor.author나종갑-
dc.contributor.authorC. H. Park-
dc.contributor.authorN. H. Heo-
dc.contributor.authorS. R. Lee-
dc.contributor.authorJ. Kim-
dc.contributor.authorK. Park-
dc.date.accessioned2015-12-02T04:57:33Z-
dc.date.available2015-12-02T04:57:33Z-
dc.date.issued199801-
dc.identifier.citationVOL 9, 323-326-
dc.identifier.issn0957-4522-
dc.identifier.other8402-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/11162-
dc.publisherJournal of materials science, Materials in electronics-
dc.subjectthin films-
dc.titlePhase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction-
dc.typeArticle-
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