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dc.contributor.authorHa, Hyoun Ji-
dc.contributor.authorKim, Min Gye-
dc.contributor.authorMa, Jin Hyun-
dc.contributor.authorJeong, Jun Hyung-
dc.contributor.authorPark, Min Ho-
dc.contributor.authorKang, Seong Jae-
dc.contributor.authorKim, Wonsik-
dc.contributor.authorPark, Soohyung-
dc.contributor.authorKang, Seong Jun-
dc.date.accessioned2024-01-19T10:00:56Z-
dc.date.available2024-01-19T10:00:56Z-
dc.date.created2023-07-27-
dc.date.issued2023-03-
dc.identifier.issn2045-2322-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/113899-
dc.description.abstractLow-temperature processing is important for improving the stability and performance of flexible quantum dot light-emitting diodes (QLEDs). In this study, QLEDs were fabricated using poly[bis(4-phenyl) (2,4,6-trimethylphenyl)amine] (PTAA) as a suitable hole transport layer (HTL) material owing to its low-temperature processability and vanadium oxide as the low-temperature solution-processable hole injection layer material. The maximum luminance and highest current efficiency of the QLEDs on a glass substrate with an optimal PTAA HTL was 8.9 x 10(4) Cd/m(2) and 15.9 Cd/A, respectively, which was comparable to that of conventional devices. The QLEDs on a flexible substrate showed a maximum luminance of 5.4 x 10(4) Cd/m(2) and highest current efficiency of 5.1 Cd/A. X-ray and ultraviolet photoelectron spectroscopies were used to investigate the chemical state and interfacial electronic structure according to the materials and the state changes of the HTL, respectively. The interfacial electronic structure showed that PTAA exhibited a better hole transport ability owing to its low hole injection barrier (Phi h). Moreover, QLEDs with a PTAA HTL could operate as photosensors under reverse bias conditions. These results indicate that the low-temperature-processed PTAA HTL is suitable for improving the performance of flexible QLEDs.-
dc.languageEnglish-
dc.publisherNature Publishing Group-
dc.titleEnhanced performance of flexible quantum dot light-emitting diodes using a low-temperature processed PTAA hole transport layer-
dc.typeArticle-
dc.identifier.doi10.1038/s41598-023-30428-y-
dc.description.journalClass1-
dc.identifier.bibliographicCitationScientific Reports, v.13, no.1-
dc.citation.titleScientific Reports-
dc.citation.volume13-
dc.citation.number1-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid001003605100029-
dc.identifier.scopusid2-s2.0-85149538015-
dc.relation.journalWebOfScienceCategoryMultidisciplinary Sciences-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.type.docTypeArticle-
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KIST Article > 2023
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