Characteristics of excimer-laser-crystallized polysilicon films by line beam scanning method.

Title
Characteristics of excimer-laser-crystallized polysilicon films by line beam scanning method.
Authors
김동환전영민주홍이창우최상삼
Issue Date
1995-01
Publisher
Materials Research Society Symposium Proceedings
Citation
v. 354, 647-652
URI
http://pubs.kist.re.kr/handle/201004/11418
Appears in Collections:
KIST Publication > Article
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