Improved Measurements of the Physical Properties of Oriental Lacquers Using Atomic Force Microscopy and a Nanoindenter

Authors
Yu, Hye HyunLim, Jung-AhLee, Kang-BongLee, Yeonhee
Issue Date
2021-05
Publisher
MDPI
Citation
POLYMERS, v.13, no.9
Abstract
Researchers have widely investigated Oriental lacquers to identify the chemical composition and have elucidated corresponding polymerization mechanisms using rigorous analytical techniques. However, researchers generally test the physical properties of Oriental lacquers by conventional methods that are perhaps overly simplistic. Here, we propose accurate and quantitative methods for evaluating the physical properties of Korean, Vietnamese, and Myanmarese lacquer films using atomic force microscopy (AFM), a nanoindenter, and a 90 degrees peel tester. We obtained surface images of the lacquers in accordance with drying time using scanning electron microscopy and AFM. The Korean lacquer film exhibited fast hardening speed, enhanced hardness, and strong adhesion strength compared with the other lacquers, although the Myanmarese lacquer film had a smoother surface than the Korean lacquer film. We used our characterization approach for evaluating a mixed Korean/Myanmarese (50/50 w/w) lacquer. Our proposed measurement techniques for Oriental lacquer films provided results that agreed with qualitative results from conventional tests. Force-distance curves in AFM and force-displacement with nanoindenter for Oriental lacquer films showed more accurate and quantitative data on the mechanical properties. Thus, researchers will find our approach useful when they optimize the chemical compositions and improve the physical properties of Oriental lacquer films for industrial applications.
Keywords
POLYMERIZATION MECHANISM; URUSHI; FILMS; TREE; SAP; POLYMERIZATION MECHANISM; URUSHI; FILMS; TREE; SAP; Oriental lacquer; natural polymer; physical properties; atomic force microscopy; nanoindenter
ISSN
2073-4360
URI
https://pubs.kist.re.kr/handle/201004/117086
DOI
10.3390/polym13091395
Appears in Collections:
KIST Article > 2021
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