Thickness dependence of crystalline orientation in YBa//2Cu//3O//x thin film grown by MOCVD.

Title
Thickness dependence of crystalline orientation in YBa//2Cu//3O//x thin film grown by MOCVD.
Authors
강원남김영환한택상최상삼C. H. KimJ. W. KangI. T. Kim
Issue Date
1996-01
Publisher
Journal of materials science letters
Citation
VOL 15, NO 21, 1898-1901
URI
http://pubs.kist.re.kr/handle/201004/11831
ISSN
0261-8028
Appears in Collections:
KIST Publication > Article
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