Plasma-Doped Si Nanosheets for Transistor and p-n Junction Application

Authors
Lee, JaejunKwon, JuyoungSeo, DongjeaNa, JukwanPark, SangwonLee, Hyo-JungLee, Seung-WooLee, Ki-YoungPark, Tae-EonChoi, Heon-Jin
Issue Date
2019-11-13
Publisher
American Chemical Society
Citation
ACS Applied Materials & Interfaces, v.11, no.45, pp.42512 - 42519
Abstract
Since the discovery of graphene, layered transition metal dichalcogenides (TMDs) have been considered promising materials for applications in various fields because of their fascinating structural features and physical properties. Doping in semiconducting TMDs is essential for their practical application. In this regard, two-dimensional (2D) Si materials have emerged as a key component of 2D electronic, optics, sensing, and spintronic devices because of their complementary metal-oxide-semiconductor (CMOS) compatibility, high-quality oxide formation, moderated bandgap, and well-established doping techniques. Here, we report the tuning of the electronic properties of Si nanosheets (NSs) using a plasma-doping technique. Using this doping process, we fabricated p-n homojunction diodes and transistors with Si NSs. The estimated high ON/OFF ratio of similar to 10(6) and field-effect hole mobility of 329 cm(2) V-1 s(-1) suggest a high crystal quality of the Si NSs. We also demonstrate vertically stacked heterostructured p-n junction diodes with MoS2, which exhibit rectifying properties and excellent light response.
Keywords
SILICON; GENERATION; MOBILITY; SILICON; GENERATION; MOBILITY; Si nanosheets; doping; CMOS compatibility; transistors; heterostructure
ISSN
1944-8244
URI
https://pubs.kist.re.kr/handle/201004/119330
DOI
10.1021/acsami.9b15616
Appears in Collections:
KIST Article > 2019
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