Three-dimensional thermal stress analysis of the re-oxidized Ni-YSZ anode functional layer in solid oxide fuel cells

Authors
Kim, Jun WooBae, KihoKim, Hyun JoongSon, Ji-wonKim, NamkeunStenfelt, StefanPrinz, Fritz B.Shim, Joon Hyung
Issue Date
2018-07-05
Publisher
ELSEVIER SCIENCE SA
Citation
JOURNAL OF ALLOYS AND COMPOUNDS, v.752, pp.148 - 154
Abstract
Nickel-yttria-stabilized zirconia (Ni-YSZ) cermet is widely used as an anode material in solid oxide fuel cells (SOFCs); however, Ni re-oxidation causes critical problems due to volume expansion, which causes high thermal stress. We fabricated a Ni-YSZ anode functional layer (AFL), which is an essential component in high-performance SOFCs, and re-oxidized it to investigate the related three-dimensional (3D) microstructural and thermo-mechanical effects. A 3D model of the re-oxidized AFL was generated using focused ion beam-scanning electron microscope (FIB-SEM) tomography. Re-oxidation of the Ni phase caused significant volumetric expansion, which was confirmed via image analysis and calculation of the volume fraction, connectivity, and two-phase boundary density. Finite element analysis (FEA) with simulated heating to 500-900 degrees C confirmed that the thermal stress in re-oxidized Ni-YSZ is concentrated at the boundaries between YSZ and re-oxidized NiO (nickel oxide). NiO is subjected to more stress than YSZ. Stress exceeding the fracture stress of 8 mol% YSZ appears primarily at 800 degrees C or higher. The stress is also more severe near the electrolyte-anode boundary than in the Ni-YSZ cermet and the YSZ regions. This may be responsible for the electrolyte membrane delamination and fracture that are observed during high-temperature operation. (C) 2018 Elsevier B.V. All rights reserved.
Keywords
FOCUSED ION-BEAM; NICKEL; REDUCTION; BEHAVIOR; MICROSTRUCTURE; PERFORMANCE; HYDROCARBON; CATHODE; RECONSTRUCTION; AGGLOMERATION; FOCUSED ION-BEAM; NICKEL; REDUCTION; BEHAVIOR; MICROSTRUCTURE; PERFORMANCE; HYDROCARBON; CATHODE; RECONSTRUCTION; AGGLOMERATION; NiO-YSZ anode functional layer; 3D reconstruction; Focused ion beam-scanning electron microscope; Finite element analysis; Thermal stress
ISSN
0925-8388
URI
https://pubs.kist.re.kr/handle/201004/121161
DOI
10.1016/j.jallcom.2018.04.176
Appears in Collections:
KIST Article > 2018
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