Effective characterization of polymer residues on two-dimensional materials by Raman spectroscopy

Authors
Park, Ji-HoonChoi, Soo HoChae, Won U. K.Stephen, BoandohPark, Hyeon KiYang, WoochulKim, Soo MinLee, Joo SongKim, Ki Kang
Issue Date
2015-12-04
Publisher
IOP PUBLISHING LTD
Citation
NANOTECHNOLOGY, v.26, no.48
Abstract
Large-area two-dimensional (2D) materials grown by chemical vapor deposition need to be transferred onto a target substrate for real applications. Poly(methyl methacrylate) as a supporting layer is widely used during the transfer process and removed after finishing it. However, it is a challenge to diminish the polymer layer completely. It is necessary to readily characterize the polymer residues on 2D materials to facilitate the removal process. Here, we report a method that characterizes the polymer residues on 2D materials by tracking the presence of G-band of amorphous carbons (a-Cs) in the Raman spectrum after forming carbonized a-Cs through thermal annealing. The C-13-graphene is employed to separate the Raman signal G-band between C-12-a-Cs and C-13-graphene in the Raman spectrum. The residence of the polymer residues is clearly confirmed by the different Raman signals of two different isotopes (C-12 and C-13) due to differences in mass. Our effective method recognizes that while the polymer residue is not easily removed on graphene, those on hexagonal boron nitride and molybdenum disulfide are almost diminished under optimum thermal annealing conditions. Our method will not only contribute to the development of a new transfer process, but also help to achieve a clean surface of 2D materials.
Keywords
CHEMICAL-VAPOR-DEPOSITION; HEXAGONAL BORON-NITRIDE; GRAPHENE FILMS; LARGE-AREA; LAYER GRAPHENE; THICKNESS; SILICON; CHEMICAL-VAPOR-DEPOSITION; HEXAGONAL BORON-NITRIDE; GRAPHENE FILMS; LARGE-AREA; LAYER GRAPHENE; THICKNESS; SILICON; graphene; polymer residue; chemical vapor deposition; C-13-graphene; amorphous carbon; carbonization
ISSN
0957-4484
URI
https://pubs.kist.re.kr/handle/201004/124637
DOI
10.1088/0957-4484/26/48/485701
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KIST Article > 2015
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