An improved understanding of the relationship between interface roughness of ZnS:Pr,Ce phosphor-Ta//2O//5 insulating film and electrical characteristics of TFEL devices

Title
An improved understanding of the relationship between interface roughness of ZnS:Pr,Ce phosphor-Ta//2O//5 insulating film and electrical characteristics of TFEL devices
Authors
김영식이윤희주병권오명환성만영신동기
Keywords
electroluminescent display(ELD)
Issue Date
1998-05
Publisher
Proc. SID '98
Citation
, 659-662
URI
http://pubs.kist.re.kr/handle/201004/12618
ISSN
0098-0966
Appears in Collections:
KIST Publication > Conference Paper
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