Decay dynamics and exciton localization in large GaAs quantum dots grown by droplet epitaxy

Authors
Tighineanu, P.Daveau, R.Lee, E. H.Song, J. D.Stobbe, S.Lodahl, P.
Issue Date
2013-10-25
Publisher
AMER PHYSICAL SOC
Citation
Physical Review B, v.88, no.15
Abstract
We investigate the optical emission and decay dynamics of excitons confined in large strain-free GaAs quantum dots grown by droplet epitaxy. From time-resolved measurements combined with a theoretical model we show that droplet-epitaxy quantum dots have a quantum efficiency of about 75% and an oscillator strength between 8 and 10. The quantum dots are found to be fully described by a model for strongly confined excitons, in contrast to the theoretical prediction that excitons in large quantum dots exhibit the so-called giant oscillator strength. We attribute these findings to localized ground-state excitons in potential minima created by material intermixing during growth. We provide further evidence for the strong-confinement regime of excitons by extracting the size of electron and hole wave functions from the phonon-broadened photoluminescence spectra. Furthermore, we explore the temperature dependence of the decay dynamics and, for some quantum dots, observe a pronounced reduction in the effective transition strength with temperature. We quantify and explain these effects as being an intrinsic property of large quantum dots owing to thermal excitation of the ground-state exciton. Our results provide a detailed understanding of the optical properties of large quantum dots in general, and of quantum dots grown by droplet epitaxy in particular.
Keywords
RESOLVED OPTICAL CHARACTERIZATION; TEMPERATURE-DEPENDENCE; SPIN RELAXATION; PHOTOLUMINESCENCE; SEMICONDUCTORS; LIFETIMES; EMISSION; SPECTRUM; RESOLVED OPTICAL CHARACTERIZATION; TEMPERATURE-DEPENDENCE; SPIN RELAXATION; PHOTOLUMINESCENCE; SEMICONDUCTORS; LIFETIMES; EMISSION; SPECTRUM; GaAs; droplet; Quantum efficiency
ISSN
2469-9950
URI
https://pubs.kist.re.kr/handle/201004/127534
DOI
10.1103/PhysRevB.88.155320
Appears in Collections:
KIST Article > 2013
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