DSpace at KIST: Characterization of Polymer Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

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DC Field	Value	Language
dc.contributor.author	이연희	-
dc.contributor.author	이지혜	-
dc.date.accessioned	2024-01-20T11:30:37Z	-
dc.date.available	2024-01-20T11:30:37Z	-
dc.date.created	2022-01-10	-
dc.date.issued	2013-10	-
dc.identifier.issn	1225-0260	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/127559	-
dc.title	Characterization of Polymer Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)	-
dc.title.alternative	비행시간형 이차이온질량분석(TOF-SIMS) 장비를 이용한 고분자 표면분석 및 최근동향	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	Polymer Science and Technology, v.24, no.5, pp.528 - 534	-
dc.citation.title	Polymer Science and Technology	-
dc.citation.volume	24	-
dc.citation.number	5	-
dc.citation.startPage	528	-
dc.citation.endPage	534	-

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