Studies of polystyrenes using time-of-flight secondary ion mass spectrometry

Title
Studies of polystyrenes using time-of-flight secondary ion mass spectrometry
Authors
이연희한승희윤정현임현의조정희
Keywords
TOF-SIMS
Issue Date
1999-01
Publisher
Journal of Surface Analysis
Citation
VOL 6, NO 1, 50-53
URI
http://pubs.kist.re.kr/handle/201004/12812
ISSN
13411756
Appears in Collections:
KIST Publication > Article
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