Mechanism maps for electromigration-induced failure of metal and alloy interconnects

Title
Mechanism maps for electromigration-induced failure of metal and alloy interconnects
Authors
Vaibhav K. AndleighV. T. Srikar박영준Carl V. Thompson
Keywords
electromigration
Issue Date
1999-12
Publisher
Journal of applied physics
Citation
VOL 86, NO 12, 6737-6745
URI
http://pubs.kist.re.kr/handle/201004/12984
ISSN
0021-8979
Appears in Collections:
KIST Publication > Article
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