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Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry

Authors

임원철; 이지혜; 이연희

Issue Date

2011-03

Citation

Journal of Surface Analysis, v.17, no.3, pp.324 - 327

Keywords

CIGS; Quantitative analysis; depth profiling; Dynamic SIMS

ISSN

1341-1756

URI

https://pubs.kist.re.kr/handle/201004/130551

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KIST Article > 2011

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