Roughness of ZnS : Pr,Ce/Ta2O5 interface and its effects on electrical performance of alternating current thin-film electroluminescent devices

Title
Roughness of ZnS : Pr,Ce/Ta2O5 interface and its effects on electrical performance of alternating current thin-film electroluminescent devices
Authors
이윤희Young-Sik Kim주병권오명환
Keywords
Electroluminescence; insulator; interface; Ta2O5; TFEL; ZnS
Issue Date
1999-05
Publisher
IEEE transactions on electron devices
Citation
VOL 46, NO 5, 892-896
URI
http://pubs.kist.re.kr/handle/201004/13077
ISSN
0018-9383
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE