Stripe domain structure in epitaxial (001) BiFeO3 thin films on orthorhombic TbScO3 substrate

Authors
Folkman, C. M.Baek, S. H.Jang, H. W.Eom, C. B.Nelson, C. T.Pan, X. Q.Li, Y. L.Chen, L. Q.Kumar, A.Gopalan, V.Streiffer, S. K.
Issue Date
2009-06-22
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.94, no.25
Abstract
We have analyzed the ferroelastic and ferroelectric domain structure of high crystalline quality (001) BiFeO3 films on orthorhombic (110) TbScO3 substrates. Two domains were present in stripes separated by (010) vertical boundaries, with spontaneous polarizations in adjacent domains rotated by 109 degrees. The striped morphology was caused by nucleation of only two ferroelastic domains on the low symmetry GdFeO3-type substrate. Domain engineering through substrate symmetry is an important finding for rhombohedral ferroelectric epitaxial thin films. The stripe pattern with vertical walls may be useful for extracting domain wall contributions to magnetism and electrical transport properties of BiFeO3 materials.
Keywords
RHOMBOHEDRAL FERROELECTRIC-FILMS; RHOMBOHEDRAL FERROELECTRIC-FILMS; bismuth compounds; dielectric polarisation; electric domains; epitaxial layers; ferroelasticity; ferroelectric thin films; nucleation; terbium compounds
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/132385
DOI
10.1063/1.3152009
Appears in Collections:
KIST Article > 2009
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