Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs

Title
Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs
Authors
현찬경S.C. Choi송상헌황성우손맹호안도열박용주김은규
Keywords
atoimic force microscopy; AFM; direct patterning; selective positioning; InAs; quatom dots
Issue Date
2000-10
Publisher
Applied physics letters
Citation
VOL 77, NO 16, 2607-2609
URI
http://pubs.kist.re.kr/handle/201004/13294
ISSN
0003-6951
Appears in Collections:
KIST Publication > Article
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