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Junction temperature measurement of InAs quanturn-dot laser diodes by utilizing voltage-temperature method

Authors

Jeong, Jung Hwa; Kim, Kyoung Chan; Il Lee, Jung; Kim, Hyun Jae; Han, Il Ki

Issue Date

2008-07

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Citation

IEEE PHOTONICS TECHNOLOGY LETTERS, v.20, no.13-16, pp.1354 - 1356

Keywords

SUPERLUMINESCENT DIODES; SUPERLUMINESCENT DIODES; forward voltage-temperature (V-T) method; junction temperature; quantum-dot (QD) laser diodes (LDs)

ISSN

1041-1135

URI

https://pubs.kist.re.kr/handle/201004/133376

DOI

10.1109/LPT.2008.926802

Appears in Collections:

KIST Article > 2008

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