Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique
- Authors
- Choi, Pyuck-Pa; Kwon, Young-Soon; Kim, Ji-Soon; Al-Kassab, Tala'at
- Issue Date
- 2007-04
- Publisher
- OXFORD UNIV PRESS
- Citation
- JOURNAL OF ELECTRON MICROSCOPY, v.56, no.2, pp.43 - 49
- Abstract
- The preparation of transmission electron microscopy (TEM) and atom probe-field ion microscopy (AP-FIM) specimens from mechanically alloyed Ti-Cu-Ni-Sn powder has been explored. Applying the focused ion beam (FIB) based in situ lift-out technique, it has been demonstrated that specimen preparation can be carried on single micrometre-sized powder particles without the use of any embedding media. Since the particles did not incorporate any micropores, as revealed by cross-sectioning, the standard procedure known for bulk samples could be simply implemented to the powder material. A sequence of rectangular cuts and annular milling was found to be a highly efficient way of forming a tip-shaped AP-FIM specimen from a square cross-section blank. A Ga level <= 1 at.% was detected if a low beam current of 10 pA was chosen for the final ion-milling stages. Implanted Ga ions were mostly confined to a zone of about 2 nm in thickness and indicated that ion-induced structural transformations were negligible.
- Keywords
- BULK AMORPHOUS-ALLOYS; FILM STRUCTURES; TEM; FIB; EXTRUSION; SEM; BULK AMORPHOUS-ALLOYS; FILM STRUCTURES; TEM; FIB; EXTRUSION; SEM; transmission electron microscopy; field ion microscopy; atom probe; focused ion beam; in-situ lift-out; powder materials
- ISSN
- 0022-0744
- URI
- https://pubs.kist.re.kr/handle/201004/134501
- DOI
- 10.1093/jmicro/dfm003
- Appears in Collections:
- KIST Article > 2007
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