Fabrication and properties of As-doped ZnO films grown on GaAs(001) substrates by radio frequency (rf) magnetron sputtering

Authors
Lee, WHwang, DKJeong, MCLee, MOh, MSChoi, WKMyoung, JM
Issue Date
2004-01-15
Publisher
ELSEVIER SCIENCE BV
Citation
APPLIED SURFACE SCIENCE, v.221, no.1-4, pp.32 - 37
Abstract
ZnO thin films were grown on GaAs(0 0 1) substrate to study the feasibility of making As-doped textured ZnO films for possible optical device application using radio frequency (rf) magnetron sputtering. It was demonstrated that highly c-axis oriented ZnO crystal with uniformly doped As could be grown using this deposition technique. Crystallinity was shown to improve with higher processing temperature. Photoluminescence spectroscopy, supplemented by cathodo-lummescence imaging, showed that the ZnO films have good optical quality with strong near band emission peak at 3.3 eV and spatially homogeneous luminescence indicating possibility of producing As-doped ZnO films with good crystallinity and optical properties using the technique used herein. (C) 2003 Elsevier B.V. All rights reserved.
Keywords
THIN-FILMS; OPTICAL-PROPERTIES; ZINC-OXIDE; ORIENTATION; LAYER; THIN-FILMS; OPTICAL-PROPERTIES; ZINC-OXIDE; ORIENTATION; LAYER; ZnO; GaAs; As doping; rf magnetron sputtering
ISSN
0169-4332
URI
https://pubs.kist.re.kr/handle/201004/137925
DOI
10.1016/S0169-4332(03)00947-4
Appears in Collections:
KIST Article > 2004
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