Optimization of tunneling magnetotransport and thermal properties in magnetic tunnel junctions by rapid thermal anneal

Authors
Lee, KIChae, KHLee, JHHa, JGRhie, KLee, WYShin, KH
Issue Date
2003-09
Publisher
ELSEVIER SCIENCE BV
Citation
MICROELECTRONIC ENGINEERING, v.69, no.2-4, pp.305 - 308
Abstract
We report on a systematic investigation of rapid thermal anneal (RTA) effects on the properties of FeMn exchange-biased magnetic tunnel junctions (MTJs). The tunneling magnetoresistance (TMR) in an as-grown MTJ is found to be similar to27%, whereas the TMR in MTJs annealed by RTA increases with annealing temperature up to 300 degreesC, reaching similar to46%. A significant change in the effective barrier thickness (t(eff)) and height (Phi(eff)) occurs within 10 s during RTA. Transmission electron microscopy and X-ray reflectivity studies demonstrate that the interface of the alumina tunnel barrier for the MTJ annealed by RTA became sharper and clearer, giving rise to the enhanced TMR. (C) 2003 Elsevier B.V. All rights reserved.
Keywords
TEMPERATURE-DEPENDENCE; STABILITY; TEMPERATURE-DEPENDENCE; STABILITY; magnetic tunnel junctions (MTJs); magnetic random access memory (MRAM); rapid thermal anneal (RTA)
ISSN
0167-9317
URI
https://pubs.kist.re.kr/handle/201004/138291
DOI
10.1016/S0167-9317(03)00313-7
Appears in Collections:
KIST Article > 2003
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE