코발트 실리사이드에 의한 게이트 측벽 기공 형성에 대한 고찰

Other Titles
A consideration of void formation mechanism at gate edge induced by cobalt silicidation
Authors
Yeong-Cheol Kim김기영김병국
Issue Date
2001-09
Publisher
한국결정성장학회
Citation
한국결정성장학회지, v.12, no.3, pp.166 - 170
Keywords
코발트 실리사이드
ISSN
1225-1429
URI
https://pubs.kist.re.kr/handle/201004/140188
Appears in Collections:
KIST Article > 2001
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE