KIST Library Institutional Repository

Electromigration-induced failure in near-bamboo interconnects

Other Titles

Electromigration 에 의한 near-bamboo 배선의 파손

Authors

박영준

Issue Date

2001-06

Publisher

대한금속.재료학회

Citation

대한금속 . 재료학회지 = Journal of the Korean Institute of Metals and Materials, v.39, no.6, pp.707 - 711

Keywords

electromigration

ISSN

1738-8228

URI

https://pubs.kist.re.kr/handle/201004/140403

Appears in Collections:

KIST Article > 2001

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML