Transmission electron microscopy (TEM) study of the degradation mechanism of amorphous vanadium oxide based thin film battery

Title
Transmission electron microscopy (TEM) study of the degradation mechanism of amorphous vanadium oxide based thin film battery
Authors
김한기성태연전은정조원일윤영수
Issue Date
2001-09
Publisher
2001 Joint International Meeting Abstract (Journal of the Electrochemical Society)
Citation
VOL 148, NO 4, #37-#37
URI
http://pubs.kist.re.kr/handle/201004/14059
Appears in Collections:
KIST Publication > Conference Paper
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