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X-ray emission spectroscopic analysis for crystallized amorphous silicon induced by excimer laser annealing

Authors

전영민; 김동환; 조운조; 이석

Issue Date

2001-03

Publisher

Optical Society of Korea

Citation

Journal of the Optical Society of Korea, v.5, no.1, pp.1 - 4

Keywords

X-ray emission spectroscopy

ISSN

1226-4776

URI

https://pubs.kist.re.kr/handle/201004/140645

Appears in Collections:

KIST Article > 2001

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