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Studies of polystyrenes using time-of-flight secondary ion mass spectrometry

Authors

이연희; 한승희; 윤정현; 임현의; 조정희

Issue Date

1999-01

Citation

Journal of Surface Analysis, v.6, no.1, pp.50 - 53

Keywords

TOF-SIMS

ISSN

1341-1756

URI

https://pubs.kist.re.kr/handle/201004/142552

Appears in Collections:

KIST Article > Others

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