Rare earth concentration in the primary Si crystal in rare earth added Al-21wt.%Si alloy

Authors
Chang, JYKim, GHMoon, IGChoi, CS
Issue Date
1998-07-03
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
SCRIPTA MATERIALIA, v.39, no.3, pp.307 - 314
Keywords
convergent beam electron diffraction (CBED)
ISSN
1359-6462
URI
https://pubs.kist.re.kr/handle/201004/142954
DOI
10.1016/S1359-6462(98)00168-7
Appears in Collections:
KIST Article > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE