Surface magnetic domain observation on thin-gauged 3% Si-Fe sheets by using Scanning Electron Microscopy with Polarization Analysis (SEMPA)

Authors
Lee, YKoymen, ARHeo, NHNa, JGWoo, JS
Issue Date
1998-07
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON MAGNETICS, v.34, no.4, pp.1165 - 1167
Abstract
The 100 mu m thick 3%Si-Fe sheets, which have magnetic induction at 10Oe (B-10) of 1.57 to 1.98 Tesla, were prepared through induction melting, hot and fold rolling, and vacuum annealing processes. Scanning Electron Microscopy with polarization Analysis (SEMPA) was used to image the surface magnetic domain structure of the 3%Si-Fe sheets in ultra-high vacuum. Two orthogonal in-plane components of the spin polarization of the secondary electrons were measured to obtain the magnetic domain images. It was observed by using SEMPA that the B-10=1.98 Tesla sample was almost composed of 180 degrees stripe domains which are parallel to the rolling direction. On the other hand, the Si-Fe sheet with B-10=1.57 Tesla:is composed of large 180 degrees stripe domains that are slanted about 30 degrees to the rolling direction. In addition, complex magnetic domain structures like tree and zigzag patterns were observed on the 1.57 Tesla sample surface.
Keywords
SEMPA; Si-Fe; magnetic domains; imaging
ISSN
0018-9464
URI
https://pubs.kist.re.kr/handle/201004/142976
DOI
10.1109/20.706430
Appears in Collections:
KIST Article > Others
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