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Measurements of Al concentration in the primary Si crystals from the rheocast Al-15.5 wt% Si alloy

Authors

Kim, GH; Lee, JI; Lee, JC; Lee, HI

Issue Date

1997-10-01

Publisher

PERGAMON-ELSEVIER SCIENCE LTD

Citation

SCRIPTA MATERIALIA, v.37, no.7, pp.929 - 936

Keywords

SILICON; SILICON; Rheocast; lattice parameter; convergent beam electron diffraction; lattice strain; Al-15.5 wt% Si alloy

ISSN

1359-6462

URI

https://pubs.kist.re.kr/handle/201004/143552

DOI

10.1016/S1359-6462(97)00189-9

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KIST Article > Others

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