Photoresponse of a YBa2Cu3Ox grain-boundary junction

Authors
Park, JHKim, DHKim, YHKang, WNChoi, SSHahn, TSKhim, ZG
Issue Date
1996-04-01
Publisher
AMER INST PHYSICS
Citation
JOURNAL OF APPLIED PHYSICS, v.79, no.7, pp.3770 - 3773
Abstract
The photoresponse of a YBa2Cu3Ox grain-boundary junction has been measured as a function of chopping frequency and bias current in a temperature range of 2 K less than or equal to T less than or equal to 70 K. The response was found to be mostly bolometric, but a nonbolometriclike component was also identified, which appeared as a chopping-frequency independent signal while immersing the sample in the superfluid helium. The bias-current dependence of the response showed a peak at a current corresponding to the critical current of the junction, and the peak values remained constant for 30 K<T<70 K. However, below 15 K the peak of the photoresponse increased very sharply with decreasing temperature following a 1/T-3 dependence, consistent with the temperature dependence of the thermal boundary resistance between the film and the substrate. (C) 1996 American Institute of Physics.
Keywords
SUPERCONDUCTING THIN-FILMS; OPTICAL-RESPONSE; EPITAXIAL-FILMS; SUPERCONDUCTING THIN-FILMS; OPTICAL-RESPONSE; EPITAXIAL-FILMS; YBa2Cu3Ox grain boundary junction
ISSN
0021-8979
URI
https://pubs.kist.re.kr/handle/201004/144473
DOI
10.1063/1.361380
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KIST Article > Others
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