DSpace at KIST: Polymer surface characterization using time-of-flight secondary ion mass spectrometry.

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DC Field	Value	Language
dc.contributor.author	이연희	-
dc.contributor.author	한승희	-
dc.date.accessioned	2024-01-21T19:44:55Z	-
dc.date.available	2024-01-21T19:44:55Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1996-01	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/144602	-
dc.title	Polymer surface characterization using time-of-flight secondary ion mass spectrometry.	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	Journal of Korean vacuum society, v.v. 5, no.no. S1, pp.94 - 99	-
dc.citation.title	Journal of Korean vacuum society	-
dc.citation.volume	v. 5	-
dc.citation.number	no. S1	-
dc.citation.startPage	94	-
dc.citation.endPage	99	-

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