Spectroscopic ellipsometric properties of Ga1-xFexAs dilute magnetic semiconductors

Title
Spectroscopic ellipsometric properties of Ga1-xFexAs dilute magnetic semiconductors
Authors
이호선T. D. Kang박용주오형택조훈영R. MoriyaH. Munekata
Keywords
dilute magnetic semiconductor; ellipsometry; dielectric function; critical point; band structure
Issue Date
2003-02
Publisher
Journal of the Korean Physical Society
Citation
VOL 42, S441-S445
URI
http://pubs.kist.re.kr/handle/201004/14593
ISSN
0374-4884
Appears in Collections:
KIST Publication > Article
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