Capacitively-coupled measurements on the frequency dependent diagonal magnetoconductance of a 2DEG in GaAs heterostructure in the quantum Hall regime

Authors
이정일P. J. StilesM. Heiblum
Issue Date
1992-02-19
Publisher
ELSEVIER
Citation
Surface Science, v.263, no.1-3, pp.120 - 124
Abstract
We have examined the complex capacitance of the 2DEG in GaAs heterostructures at a temperature of 1.3 K, magnetic fields up to 8 T and over a range of frequencies from 200 Hz to 100 kHz. The experiment was performed on a high mobility GaAs/AlGaAs heterostructure from an MBE grown wafer with Corbino geometry. We find that the real and imaginary parts of the complex capacitance of the capacitively-coupled structure, are well explained by a one-dimensional diffusion model and the derived diagonal magnetoconductances in the Landau gap regions are in good agreement with those directly measured via a capacitively coupled structure (triple dip method). Spin splitting was also observed at magnetic fields as low as 2.5 T. The value of the enhanced g-factor at high magnetic fields was larger than 2 which is comparable to those determined by conductivity measurements using ohmic contacts. ? 1992.
Keywords
SILICON INVERSION-LAYERS; DIMENSIONAL ELECTRON-GAS; MAGNETOCAPACITANCE MEASUREMENTS; COMPLEX CAPACITANCE; DENSITY; STATES; ENHANCEMENT; RESISTANCE; 2DEG; quantum Hall; heterostructure
ISSN
0039-6028
URI
https://pubs.kist.re.kr/handle/201004/146467
DOI
10.1016/0039-6028(92)90319-2
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