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SIMPLE METHOD TO EXTRACT GATE VOLTAGE DEPENDENT SOURCE DRAIN RESISTANCE IN MOSFETS

Authors

LEE, JI; LEE, MB; LEE, YJ; HAN, IK; KANG, KN; PARK, KO

Issue Date

1990-10-11

Publisher

IEE-INST ELEC ENG

Citation

ELECTRONICS LETTERS, v.26, no.21, pp.1806 - 1807

Keywords

Fets; materials testing; Semiconductor devices; Semiconductor devices and materials

ISSN

0013-5194

URI

https://pubs.kist.re.kr/handle/201004/147040

DOI

10.1049/el:19901156

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KIST Article > Others

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