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SIMPLE EXTRACTION METHOD FOR MOBILITY PARAMETERS IN SI-MOSFETS AT 77-K

Authors

LEE, JI; LEE, MB; KANG, KN; PARK, KO

Issue Date

1990-06-21

Publisher

IEE-INST ELEC ENG

Citation

ELECTRONICS LETTERS, v.26, no.13, pp.852 - 854

Keywords

FETs; materials; materials testing; Semiconductor devices; Semiconductor devices

ISSN

0013-5194

URI

https://pubs.kist.re.kr/handle/201004/147087

DOI

10.1049/el:19900558

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KIST Article > Others

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