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열처리된 InP-MIS 구조 시료에 대한 깊은 준위 결함상태 .

Authors

김은규; 조훈영; 윤주훈; 민석기; 정영래; 이완호

Issue Date

1990-02

Citation

새물리, v.v. 30, no.no. 1, pp.35 - 40

Keywords

InP-MIS structure; thermal annealing; deep level trap

URI

https://pubs.kist.re.kr/handle/201004/147148

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KIST Article > Others

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